Skip to main content
Smart, Advanced Memory devices and Applications lab
Smart, Advanced Memory devices and Applications lab
Main navigation
Home
People
All Profiles
Principal Investigators
Postdoctoral Fellows
Students
Alumni
Former Members
Visiting Scholars
Events
All Events
Events Calendar
News
Research
Publications
Contact Us
industry
Getting the jump on industrial failures
1 min read ·
Sat, Nov 26 2016
News
applied mathematics
statistics
industry
A statistics-driven method for the early detection of emerging problems in industrial processes could improve industrial safety, reliability and productivity.